A correlation noise spectrometer for flicker noise measurement in graphene samples
نویسندگان
چکیده
منابع مشابه
Flicker Noise Characteristics in GaAs MOSFETs
This study reports the flicker noise characteristics in GaAs-based MOSFETs for the first time. With the improvement in Ga 2 O 3 (Gd 2 O 3) insulators, GaAs MOSFETs reveal the possibility for high-speed and high-power applications, resulting from an electronic mobility that is about five times greater than that in Si, and the advantage of semi-insulating substrate. The DC and RF characteristics ...
متن کاملShot noise in graphene.
We report measurements of current noise in single-layer and multilayer graphene devices. In four single-layer devices, including a p-n junction, the Fano factor remains constant to within +/-10% upon varying carrier type and density, and averages between 0.35 and 0.38. The Fano factor in a multilayer device is found to decrease from a maximal value of 0.33 at the charge-neutrality point to 0.25...
متن کاملFlicker noise near the percolation threshold
2014 An effective-medium theory, for the flicker (1/f) noise amplitude, is formulated for random resistor networks. Close to the percolation threshold pc, the magnitude of the noise is shown to diverge as (p pc)-03BA, with 03BA = 1 for both site and bond percolation models. The exponent 03BA is also calculated in the framework of two different renormalization group transformations. The possible...
متن کاملMeasurement Noise versus Process Noise in Ionosphere Estimation for WAAS
One of the parameters driving the performance of the Wide Area Augmentation System (WAAS) is the Grid Ionospheric Vertical Error (GIVE). The GIVE bounds the estimation error of the ionospheric delay at each Ionospheric Grid Point (IGP). The GIVE is generated such that a user interpolating both the vertical ionospheric delays at the IGP and the GIVE, is protected. The GIVE is a function of sever...
متن کاملFlicker Noise in a Model of Coevolving Biological Populations
Per Arne Rikvold and R.K.P. Zia School of Computational Science and Information Technology, Center for Materials Research and Technology, and Department of Physics, Florida State University, Tallahassee, Florida 32306-4120 Center for Stochastic Processes in Science and Engineering, Department of Physics, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061-0435 (Dated: Febr...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Measurement Science and Technology
سال: 2019
ISSN: 0957-0233,1361-6501
DOI: 10.1088/1361-6501/aafcab